Merging of Test Cubes using Test Point Insertion for Low-Power Test Compaction
نویسندگان
چکیده
منابع مشابه
Generation of Low Power Test Set by Merging Functional Broadside Test Based Skewed Load Test Cubes
Low power test set is generated by merging of the skewed load test cubes that are extracted from the functional broadside tests. The use of functional broadside tests ensures that switching activity of the extracted tests does not exceed that possible during functional operation of the circuit. As the switching activity is prevented from exceeding the switching activity that the circuit is desi...
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The generation of minimal sets for faults detection in digital circuits, is an important problem in the industry. Unfortunately, the problem has been demonstrated to be NP-hard. In this report we present six heuristics capable to reduce a given sets of test-cubes to a minimal set of test-cases, with an average compression of about the 95%. The methods that we propose, combine together personal ...
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Efficient production testing is frequently hampered because (cores in) current complex digital circuit designs require too large test sets, even with powerful ATPG tools that generate compact test sets. Built-In Self-Test approaches often suffer from fault coverage problems, due to randomresistant faults, which can successfully be improved by means of Test Point Insertion (TPI). In this paper, ...
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The objective of manufacturing test is to separate the faulty circuits from the good circuits after they have been manufactured. Three problems encompassed by this task will be mentioned here. First, the reduction of the power consumed during test. The behavior of the circuit during test is modified due to scan insertion and other testing techniques. Due to this, the power consumed during test ...
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ژورنال
عنوان ژورنال: IJARCCE
سال: 2015
ISSN: 2278-1021
DOI: 10.17148/ijarcce.2015.4389